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Specifications

Maximum scan speed of up to  50 frames/sec with 100 ¡Ñ100 nm2 scan range and 10 k pixels

• Atomic defect resolution in  closed-loop

• Designed for medium to small sized cantilevers for lowest forces and highest scan speeds

• Ultra-low noise cantilever-deflection detection system

• IR cantilever-deflection detection light  source with small spot size

• Optional photothermal cantilever drive. 730 nm wavelength ensures minimal sample interaction compared to blue-light excitation

• Highest detector bandwidth of  8 MHz for high speed signal capture

• Automated laser and detector   alignment

• Scanner unit

• 2 ¡Ñ 2 ¡Ñ 1.5 £gm3 scan range

• Sensor noise level < 0.09 nm RMS in xy

• 0.04 nm RMS sensor noise level in z

• Highest resonance frequency for z axis of >180 kHz

• Typical sample size 4 mm diameter

Control electronics

• Vortis 2 Speed controller: State-of-the-art, digital controller  with lowest noise levels and  highest flexibility

• Newly designed, high-voltage power amplifier drives the scanner unit

New workflow-based V7 SPMControl software

• True multi-user platform, ideal for imaging facilities

• User-programmable software

• AutoAlignment and setup

• Advanced feedback algorithms

• Fully automated sensitivity and spring constant calibration using thermal noise or Sader method

• Improved ForceWatch? and  TipSaver? mode for force spectroscopy and imaging

• Advanced spectroscopy modes, e.g. various force clamp modes or ramp designs

• Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.

• Powerful batch processing of force curves and images, including WLC, FJC, step-fitting, JKR, DMT model and other analyses